Establishment of a 'High-Performance X-ray Photoelectron Spectrometer' at the Core Research Support Center
CT (Circuit Board X-ray 3D Tomography) of the Convergence Component Materials Core Research Support Center at Dong-Eui University.
[Asia Economy Yeongnam Reporting Headquarters Reporter Kim Yong-woo] In the ‘Basic Science Research Capacity Enhancement Project’ announced by the Ministry of Education, the ‘Research Equipment Establishment Support Project’ proposed by the Dong-Eui University Convergence Parts and Materials Core Research Support Center was selected.
The Dong-Eui University Industry-Academic Cooperation Foundation announced on the 3rd that the Ministry of Education selected and announced 12 projects this year on June 30.
In the basic science category, five universities including POSTECH and Mokpo National University were selected; in the life sciences category, three universities including Seoul National University and Sogang University were selected; and in the mechanical, parts, energy, and information electronics category, four universities including Dong-Eui University and Sungkyunkwan University were selected.
With this project selection, Dong-Eui University will establish a ‘High Performance X-ray Photoelectron Spectrometer’ at the Convergence Parts and Materials Core Research Support Center with a budget of 520 million KRW by the end of February next year.
The ‘High Performance X-ray Photoelectron Spectrometer’ is equipment most frequently used by researchers in NT fields such as semiconductors, displays, metals, oxides, powders, glass, plastics, polymers, carbon, ceramics, bio, fibers, coatings, and thin films for convergence parts and materials, focusing on fundamental core source technologies and functional organic (inorganic) nanomaterials research.
When X-rays with strong energy irradiate the surface of a material, electrons bound to various atoms are ejected, and by measuring the binding energy of these electrons, information about the types and amounts of elements on the surface and their bonding states can be obtained.
The X-ray photoelectron spectrometer is equipment that analyzes the surface characteristics of advanced functional materials (conductors, insulators) and can analyze the types, amounts, and bonding states of elements present in thin and ultra-thin films at depths ranging from one hundred-millionth to about 100 meters (10~100 nm).
Lee Won-jae, director of the Convergence Parts and Materials Core Research Support Center (professor of Electrical and Electronic Materials Engineering), said, “Research is underway to reduce weight and size and accumulate more data to improve the performance and price competitiveness of semiconductors and functional new materials,” adding, “Many researchers synthesize nanoparticles smaller than the thickness of a hair and coat these small particles as thin films on devices to develop more competitive parts and materials.”
The Dong-Eui University Convergence Parts and Materials Core Research Support Center, which focuses on research using thin films and coatings for convergence parts and materials, is expected to greatly contribute to strengthening regional industrial competitiveness by facilitating joint research through the introduction and operation of the high-performance X-ray photoelectron spectrometer alongside currently operating imaging analysis and manufacturing process equipment.
Through the Ministry of Education’s ‘Basic Science Research Capacity Enhancement Project,’ Dong-Eui University operates the Convergence Parts and Materials Core Research Support Center (2019?2024, project budget 2.7 billion KRW) and the Bio-Tissue Regeneration Core Research Support Center (2020?2025, project budget 2.9 billion KRW).
The Core Research Support Centers are projects that support maximizing research capacity by concentrating and jointly utilizing facilities and equipment in specialized research fields that require national competitiveness. Dong-Eui University is the only university in the southeastern region operating two Core Research Support Centers.
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